Enhanced dielectric constant resolution of thin insulating films by electrostatic force microscopy

May 20, 2013 | News, News about Publications

Enhanced dielectric constant resolution of thin insulating films by electrostatic force microscopy.

E. Castellano.Hernández, J. Moreno-Llorena, J.J. Sáenz, et al.
Journal of Physics: Condensed Matter, 24, 155303 (2012).